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Transmission Electron Microscopy 2

Transmission Electron Microscopy 2, Total:28 items.

In the international standard classification, Transmission Electron Microscopy 2 involves: Optics and optical measurements, Metrology and measurement in general, Analytical chemistry, Optical equipment, Education, Optoelectronics. Laser equipment, Testing of metals.

Professional Standard - Education, Transmission Electron Microscopy 2

• JY/T 011-1996 General Principles of Transmission Electron Microscopy
• JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy

Professional Standard - Machinery, Transmission Electron Microscopy 2

• JB/T 9352-1999 Test method for the transmission electron microscope
• JB/T 5383-1991 Specification for transmission electron microscope
• JB/T 5585-1991 Test method of transmission electron microscope resolution
• JB/T 5586-1991 Classification and basic parameter of transmission electron microscope
• JB/T 5584-1991 Test method of transmission electron microscope amplification

National Metrological Verification Regulations of the People's Republic of China, Transmission Electron Microscopy 2

• JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
• JJG(地質) 1016-1990 Calibration Regulations for Transmission Electron Microscopy

Group Standards of the People's Republic of China, Transmission Electron Microscopy 2

• T/CSTM 00162-2020 Calibration methods for transmission electron microscope

GSO, Transmission Electron Microscopy 2

• OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
• BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
• GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

International Organization for Standardization (ISO), Transmission Electron Microscopy 2

• ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
• ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
• ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

British Standards Institution (BSI), Transmission Electron Microscopy 2

• BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
• 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
• BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Transmission Electron Microscopy 2

• GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
• GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
• GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens

國家市場監督管理總局、中國國家標準化管理委員會, Transmission Electron Microscopy 2

• GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy

Shanghai Provincial Standard of the People's Republic of China, Transmission Electron Microscopy 2

• DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Korean Agency for Technology and Standards (KATS), Transmission Electron Microscopy 2

• KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
• KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope

KR-KS, Transmission Electron Microscopy 2

• KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope

工業和信息化部, Transmission Electron Microscopy 2

• YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy

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