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Scanning Electron Microscopy

Scanning Electron Microscopy, Total:21 items.

In the international standard classification, Scanning Electron Microscopy involves: Optics and optical measurements, Textile fibres, Optical equipment, Protection against crime, Linear and angular measurements, Surface treatment and coating, Air quality.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Scanning Electron Microscopy

• GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
• GB/T 16594-1996 Micron grade lenght measurement by SEM
• GB/T 31563-2015 Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
• GB/T 17722-1999 Gold-plated thickness measurement by SEM

Professional Standard - Aviation, Scanning Electron Microscopy

• HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry

National Metrological Verification Regulations of the People's Republic of China, Scanning Electron Microscopy

• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
• JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Public Safety Standards, Scanning Electron Microscopy

• GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy

International Organization for Standardization (ISO), Scanning Electron Microscopy

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Inner Mongolia Provincial Standard of the People's Republic of China, Scanning Electron Microscopy

• DB15/T 3564-2024 Quantitative analysis of cashmere, sheep wool and their mixtures, scanning electron microscope fine-grained image recognition method

Japanese Industrial Standards Committee (JISC), Scanning Electron Microscopy

• JIS K 0132:1997 General rules for scanning electron microscopy

Jiangsu Provincial Standard of the People's Republic of China, Scanning Electron Microscopy

• DB32/T 4546-2023 Technical specifications for automated inspection of diatom images using scanning electron microscopes

Professional Standard - Judicatory, Scanning Electron Microscopy

• SF/T 0139-2023 Soil inspection scanning electron microscope/X-ray energy spectrometry

Professional Standard - Commodity Inspection, Scanning Electron Microscopy

• SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy

Professional Standard - Machinery, Scanning Electron Microscopy

• JB/T 6842-1993 Test method of scanning electron microscope
• JB/T 5384-1991 Scanning electron microscope - Technical specification

National Metrological Technical Specifications of the People's Republic of China, Scanning Electron Microscopy

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Fujian Provincial Standard of the People's Republic of China, Scanning Electron Microscopy

• DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Association of German Mechanical Engineers, Scanning Electron Microscopy

• VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

SCC, Scanning Electron Microscopy

• VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
• 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

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